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Electronics news

New Advanced Testing and Inspection at NEPCON Japan 2024

Test Research, Inc. (TRI), a leading provider of test and inspection systems for the electronics industry, will be exhibiting at NEPCON Japan 2024 at Tokyo Big Sight from January 24-26, 2024, to showcase the most advanced test and inspection solutions for the smart factory.

Visit booth # E17-16 to see the latest innovations in test and inspection for the electronics industry.

TRI will showcase its recently released systems: the 3D SEMI SPI TR7007Q SII-S and the 3D SEMI AOI TR7700Q SII-S for 3D optical inspection. SEMI's optical inspection systems are designed for high-reliability industries. They offer superior technical features: 25MP high-speed camera, 3.5 / 5µm high resolution, AI-Powered and Metrology Ready.

Also on display at NEPCON Japan will be: the TR7500QE Plus high-speed multi-camera 3D AOI, the world-class high-speed 3D CT AXI TR7600 SIII for various industries, and the most compact ICT on the market, the TR5001T SII Tiny.

AI solutions from TRI include AI Smart Programming, AI Repair Station and more. TRI's test and control solutions are compliant with Industry 4.0 standards such as IPC-Hermes-9852, IPC-CFX and IPC-DPMX.