Gowin Semiconductor, a corporation that designs and manufactures programmable logic devices (PLDs), announced that the GOWIN EDA FPGA design environment has been certified for compliance with ISO 26262 and IEC 61508 functional safety standards by the TUV test lab.
The certification gives automotive OEMs confidence that designs incorporating GOWIN Arora-V (medium density), Arora-II (low/medium density) or LittleBee (low density) FPGAs can meet the system-level functional safety requirements of ISO 26262 and IEC 61508. Gowin Semiconductor's Arora V FPGA family is designed for high-performance applications.
It features:
- high-speed interfaces (270 Mbps to 12.5 Gbps);
- PCIe 2.1 hard core with support for PCIe x1, x2, x8 modes;
- single-channel MIPI hard core module with speed up to 2.5 Gbit/s;
- DDR3 interface with speed up to 1333 Mbit/s.
Receipt of functional safety certification is expected to generate increased interest in GOWIN's FPGAs, which are available in AEC-Q100 Grade 2 certified versions (AEC-Q100 Grade 1 is pending). GOWIN's product range has quality and reliability certifications: IATF16949, ISO 9001, ISO 14001 and ISO/IEC 17025.
It features:
- high-speed interfaces (270 Mbps to 12.5 Gbps);
- PCIe 2.1 hard core with support for PCIe x1, x2, x8 modes;
- single-channel MIPI hard core module with speed up to 2.5 Gbit/s;
- DDR3 interface with speed up to 1333 Mbit/s.
Receipt of functional safety certification is expected to generate increased interest in GOWIN's FPGAs, which are available in AEC-Q100 Grade 2 certified versions (AEC-Q100 Grade 1 is pending). GOWIN's product range has quality and reliability certifications: IATF16949, ISO 9001, ISO 14001 and ISO/IEC 17025.